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Influence of post-annealing on properties of α-Ga2O3 epilayer grown by halide vapor phase epitaxy

  • Hoki Son
  • , Ye Ji Choi
  • , Yong Ho Ra
  • , Young Jin Lee
  • , Jin Ho Kim
  • , Sun Woog Kim
  • , Tae Young Lim
  • , Jonghee Hwang
  • , Dae Woo Jeon*
  • *Corresponding author for this work
  • Korea Institute of Ceramic Engineering Technology

Research output: Contribution to conferenceConference paperpeer-review

Abstract

Effect of annealing to realize high-quality α-Ga2O3 epilayers grown by halide vapor phase epitaxy has been studied. The structural and optical properties of α-Ga2O3 changed with changing annealing duration. In particular, for an annealing duration of 3 min, the crystal quality improved from 51 and 2757 arcsec to 28 and 1539 arcsec for (0006) and (10-14) FWHM, respectively. X-ray photoelectron spectroscopy results confirmed that the oxygen gas during annealing reacted to compensate the oxygen vacancies in the α-Ga2O3 epilayers. These results show that the optimized thermal annealing improved the crystal quality of α-Ga2O3 epilayers.

Original languageEnglish
Title of host publication2019 Compound Semiconductor Week, CSW 2019 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728100807
DOIs
StatePublished - 2019.05
Event2019 Compound Semiconductor Week, CSW 2019 - Nara, Japan
Duration: 2019.05.192019.05.23

Publication series

Name2019 Compound Semiconductor Week, CSW 2019 - Proceedings

Conference

Conference2019 Compound Semiconductor Week, CSW 2019
Country/TerritoryJapan
CityNara
Period19.05.1919.05.23

Keywords

  • annealing
  • HVPE
  • α-GaO

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