Abstract
GaN epilayers were grown on GaN/SiN double buffer layers by metalorganic chemical vapor deposition. The GaN epilayers grown on the GaN/SiN buffer showed some improvement in structural and optical properties. The SiN buffer layers were found to be porous with many nanometer-sized holes. It was suggested that dislocations which were responsible for deep levels were reduced in the GaN on the porous SiN buffer layer.
| Original language | English |
|---|---|
| Pages (from-to) | 487-491 |
| Number of pages | 5 |
| Journal | Journal of Crystal Growth |
| Volume | 249 |
| Issue number | 3-4 |
| DOIs | |
| State | Published - 2003.03 |
Keywords
- A1. Growth models
- A1. Nucleation
- A3. Metalorganic chemical vapor deposition
- B2. Semiconducting III-V materials
Quacquarelli Symonds(QS) Subject Topics
- Materials Science
- Chemistry
- Physics & Astronomy
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