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Influence of ZnTe separation layer thickness on optical properties in CdTe/ZnTe double quantum dots on Si substrates

  • Kee Hong Lim
  • , Minh Tan Man*
  • , Anh Thi Le
  • , Jin Chul Choi
  • , Hong Seok Lee
  • *Corresponding author for this work

Research output: Contribution to journalJournal articlepeer-review

Abstract

We investigate the influence of the ZnTe separation layer thickness on the photoluminescence (PL) dynamics of CdTe/ZnTe double quantum dots (DQDs) on Si substrates. The results clarify that the DQD's structure effectively improves the limit of the carrier collection and the thermal stability of the corresponding single-layer QDs. The unusual temperature-dependent PL is explained using the single model for thermal redistribution of carrier states. This model indicates that the main nonradiative process at high temperatures is caused by scattering via multiphonons with longitudinal optical phonon energy of about 19–21.3 meV. The confinement-induced mixing and electron-carrier coupling effects cause blue-shift and enhanced PL intensity. We propose that the separation layer controls carrier dynamics in optoelectronic devices by modulating the thermal escape and e-h pairs in the intermixing layers.

Original languageEnglish
Article number137893
JournalThin Solid Films
Volume699
DOIs
StatePublished - 2020.04.1

Keywords

  • Cadmium telluride
  • Carrier confinement
  • Quantum dots
  • Silicon substrate
  • Thermal escape

Quacquarelli Symonds(QS) Subject Topics

  • Materials Science
  • Physics & Astronomy

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