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InGaN/GaN multi-quantum well distributed Bragg reflector laser diode

  • Jaehee Cho*
  • , S. Cho
  • , B. J. Kim
  • , S. Chae
  • , C. Sone
  • , O. H. Nam
  • , J. W. Lee
  • , Y. Park
  • , T. I. Kim
  • *Corresponding author for this work
  • Samsung

Research output: Contribution to journalJournal articlepeer-review

Abstract

An electrically injected InGaN/GaN-based distributed Bragg reflector (DBR) laser was demonstrated. Surface grating was formed on both sides of ridge waveguide by chemically assisted ion beam etching technique. The observed threshold current was 375 mA with threshold voltage of 15.1 V for 500 X 3 μm2 devices. The emission of the DBR laser occurred in a single longitudinal mode at a wavelength of 401.3 nm. The ratio of sidemode suppression was found to be more than 13 dB until a current injection of 1 A.

Original languageEnglish
Pages (from-to)1489-1491
Number of pages3
JournalApplied Physics Letters
Volume76
Issue number12
DOIs
StatePublished - 2000.03.20

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