Abstract
Synchrotron radiation based photoemission spectroscopy (SRPES) and low energy electron diffraction (LEED) are used to study the interaction between Ag atoms and the Si(1 1 1)1 × 1-H surface. At an Ag coverage of 0.063 monolayers (ML) on the Si(1 1 1)1 × 1-H surface, the Si 2p component corresponding to Si-H bonds decreases, and an additional Si 2p component appears which shifts to a lower binding energy by 109 meV with respect to the Si bulk peak. The new Si 2p component is also observed for 0.25 ML Ag on the Si(1 1 1)7 × 7 surface. These findings suggest that Ag atoms replace the H atoms of the Si(1 1 1)1 × 1-H surface and form direct Ag-Si bonds. Contrary to the widely accepted view that there is no chemical interaction between Ag particles and the H-passivated Si surface, these results are in good agreement with recent first-principles calculations.
| Original language | English |
|---|---|
| Pages (from-to) | 853-856 |
| Number of pages | 4 |
| Journal | Surface Science |
| Volume | 604 |
| Issue number | 9-10 |
| DOIs | |
| State | Published - 2010.05.15 |
Keywords
- Ag-Si bonds
- Low energy electron diffraction
- Si(1 1 1)1 × 1-H surface
- Silver atoms
- Synchrotron radiation based photoemission spectroscopy
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