Abstract
This paper shows the results and the limitations of a 21% N-Cz 239-cm2 screen-printed cell with blanket p+ emitter and n+ back surface field. In addition, we show the properties and impact of tunnel oxide capped with doped n+ polysilicon and metal on the back side, which can overcome those limitations. Since both the doped n+ layer and the metal contact are outside the bulk silicon wafer, the Jo is dramatically reduced, resulting in much higher Voc. Process optimization has resulted in high iVoc of 728 mV on symmetric structures. The unmetallized cell structure with Al2O3/SiN passivated lightly doped p+ emitter and a tunnel oxide/n+ poly back also gave high iVoc of 734 mV. The finished screen-printed 132-cm2 device gave a Voc of 683 mV, Jsc of 39.4 mA/cm2, FF of 77.6%, and an efficiency of 20.9%. Cell analysis show that implementation of a selective emitter can give higher efficiency.
| Original language | English |
|---|---|
| Article number | 7339421 |
| Pages (from-to) | 153-158 |
| Number of pages | 6 |
| Journal | IEEE Journal of Photovoltaics |
| Volume | 6 |
| Issue number | 1 |
| DOIs | |
| State | Published - 2016.01 |
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 7 Affordable and Clean Energy
Keywords
- Crystalline
- n-type
- passivated contact
- poly silicon
- tunnel oxide
Quacquarelli Symonds(QS) Subject Topics
- Materials Science
- Engineering - Electrical & Electronic
- Engineering - Petroleum
- Physics & Astronomy
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