TY - GEN
T1 - Ionisation models for nano-scale simulation
AU - Seo, Hee
AU - Pia, Maria Grazia
AU - Saracco, Paolo
AU - Kim, Chan Hyeong
PY - 2010
Y1 - 2010
N2 - Two theory-driven models of electron ionization cross sections, the Binary-Encounter-Bethe model and the Deutsch-Mrk model, have been design and implemented; they are intended to extend the simulation capabilities of the Geant4 toolkit. The resulting values, along with the cross sections included in the EEDL data library, have been compared to an extensive set of experimental data, covering more than 50 elements over the whole periodic table.
AB - Two theory-driven models of electron ionization cross sections, the Binary-Encounter-Bethe model and the Deutsch-Mrk model, have been design and implemented; they are intended to extend the simulation capabilities of the Geant4 toolkit. The resulting values, along with the cross sections included in the EEDL data library, have been compared to an extensive set of experimental data, covering more than 50 elements over the whole periodic table.
UR - https://www.scopus.com/pages/publications/79960302992
U2 - 10.1109/NSSMIC.2010.5873721
DO - 10.1109/NSSMIC.2010.5873721
M3 - Conference paper
AN - SCOPUS:79960302992
SN - 9781424491063
T3 - IEEE Nuclear Science Symposium Conference Record
SP - 86
EP - 89
BT - IEEE Nuclear Science Symposuim and Medical Imaging Conference, NSS/MIC 2010
T2 - 2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010
Y2 - 30 October 2010 through 6 November 2010
ER -