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Ionisation models for nano-scale simulation

  • Hee Seo*
  • , Maria Grazia Pia
  • , Paolo Saracco
  • , Chan Hyeong Kim
  • *Corresponding author for this work
  • Hanyang University
  • National Institute for Nuclear Physics

Research output: Contribution to conferenceConference paperpeer-review

Abstract

Two theory-driven models of electron ionization cross sections, the Binary-Encounter-Bethe model and the Deutsch-Mrk model, have been design and implemented; they are intended to extend the simulation capabilities of the Geant4 toolkit. The resulting values, along with the cross sections included in the EEDL data library, have been compared to an extensive set of experimental data, covering more than 50 elements over the whole periodic table.

Original languageEnglish
Title of host publicationIEEE Nuclear Science Symposuim and Medical Imaging Conference, NSS/MIC 2010
Pages86-89
Number of pages4
DOIs
StatePublished - 2010
Event2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010 - Knoxville, TN, United States
Duration: 2010.10.302010.11.6

Publication series

NameIEEE Nuclear Science Symposium Conference Record
ISSN (Print)1095-7863

Conference

Conference2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010
Country/TerritoryUnited States
CityKnoxville, TN
Period10.10.3010.11.6

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