Local structural and magnetic properties of Zn_1-xMn _xTe semiconductor films

We investigated the local structural properties around the Zn and the Mn atoms of Zn_1-xMn_xTe (ZMT) magnetic semiconductor films (x = 0.16 and 0.27) by using the X-ray absorption fine structure (XAFS). The ZMT films were synthesized with a hot-wall epitaxy process. The XAFS measurements at the Zn K edge revealed that the ZMT films had an ordered zinc-blende structure and that no distinguishable structural disorder existed in any atomic pair independent of the Mn composition ratio. The XAFS analysis at the Mn K edge demonstrated that the Mn ions had a chemical valence state of 2+ and that they were exactly substituted at the Zn site. DC magnetization measurements from the specimens did not show a ferromagnetic property in the temperature range of 5 ∼ 300 K.