Local structural, magnetic, and optical properties of Zn 1-xFexO thin films

S. Y. Seo; C. H. Kwak; S. H. Kim; B. H. Kim; C. I. Park; S. H. Park; S. W. Han

doi:10.1016/j.jcrysgro.2010.04.033

Local structural, magnetic, and optical properties of Zn _1-xFe_xO thin films

S. Y. Seo
, C. H. Kwak
, S. H. Kim
, B. H. Kim
, C. I. Park
, S. H. Park
, S. W. Han^*

^*Corresponding author for this work

Physics Education

Research output: Contribution to journal › Journal article › peer-review

10 Scopus citations

Abstract

High quality Zn_1-xFe_xO thin films were deposited on α-sapphire substrates by RF magnetron sputtering. X-ray absorption fine structure measurements showed that the chemical valence of Fe ions in the films was a mixture of 2 and 3 states, and Fe ions substituted mainly for the Zn sites in the films. DC-magnetization measurements revealed ferromagnetic properties from 5 to 300 K. The photoluminescence measurements at 15 K showed a sharp main transition peak at 3.35 eV along with a broad impurity peak at 2.45 eV. The structural and magnetization analyses of the Zn_1-xFe_xO films strongly suggested that the ferromagnetism was the intrinsic properties of the films.

Original language	English
Pages (from-to)	2093-2097
Number of pages	5
Journal	Journal of Crystal Growth
Volume	312
Issue number	14
DOIs	https://doi.org/10.1016/j.jcrysgro.2010.04.033
State	Published - 2010.07.1

Keywords

A1. Structure
A3. Film
A3. Sputtering

Quacquarelli Symonds(QS) Subject Topics

Materials Science
Chemistry
Physics & Astronomy

Access to Document

10.1016/j.jcrysgro.2010.04.033

Cite this

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title = "Local structural, magnetic, and optical properties of Zn 1-xFexO thin films",

abstract = "High quality Zn1-xFexO thin films were deposited on α-sapphire substrates by RF magnetron sputtering. X-ray absorption fine structure measurements showed that the chemical valence of Fe ions in the films was a mixture of 2 and 3 states, and Fe ions substituted mainly for the Zn sites in the films. DC-magnetization measurements revealed ferromagnetic properties from 5 to 300 K. The photoluminescence measurements at 15 K showed a sharp main transition peak at 3.35 eV along with a broad impurity peak at 2.45 eV. The structural and magnetization analyses of the Zn1-xFexO films strongly suggested that the ferromagnetism was the intrinsic properties of the films.",

keywords = "A1. Structure, A3. Film, A3. Sputtering",

author = "Seo, \{S. Y.\} and Kwak, \{C. H.\} and Kim, \{S. H.\} and Kim, \{B. H.\} and Park, \{C. I.\} and Park, \{S. H.\} and Han, \{S. W.\}",

year = "2010",

month = jul,

day = "1",

doi = "10.1016/j.jcrysgro.2010.04.033",

language = "English",

volume = "312",

pages = "2093--2097",

journal = "Journal of Crystal Growth",

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number = "14",

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TY - JOUR

T1 - Local structural, magnetic, and optical properties of Zn 1-xFexO thin films

AU - Seo, S. Y.

AU - Kwak, C. H.

AU - Kim, S. H.

AU - Kim, B. H.

AU - Park, C. I.

AU - Park, S. H.

AU - Han, S. W.

PY - 2010/7/1

Y1 - 2010/7/1

N2 - High quality Zn1-xFexO thin films were deposited on α-sapphire substrates by RF magnetron sputtering. X-ray absorption fine structure measurements showed that the chemical valence of Fe ions in the films was a mixture of 2 and 3 states, and Fe ions substituted mainly for the Zn sites in the films. DC-magnetization measurements revealed ferromagnetic properties from 5 to 300 K. The photoluminescence measurements at 15 K showed a sharp main transition peak at 3.35 eV along with a broad impurity peak at 2.45 eV. The structural and magnetization analyses of the Zn1-xFexO films strongly suggested that the ferromagnetism was the intrinsic properties of the films.

AB - High quality Zn1-xFexO thin films were deposited on α-sapphire substrates by RF magnetron sputtering. X-ray absorption fine structure measurements showed that the chemical valence of Fe ions in the films was a mixture of 2 and 3 states, and Fe ions substituted mainly for the Zn sites in the films. DC-magnetization measurements revealed ferromagnetic properties from 5 to 300 K. The photoluminescence measurements at 15 K showed a sharp main transition peak at 3.35 eV along with a broad impurity peak at 2.45 eV. The structural and magnetization analyses of the Zn1-xFexO films strongly suggested that the ferromagnetism was the intrinsic properties of the films.

KW - A1. Structure

KW - A3. Film

KW - A3. Sputtering

UR - https://www.scopus.com/pages/publications/77955228124

U2 - 10.1016/j.jcrysgro.2010.04.033

DO - 10.1016/j.jcrysgro.2010.04.033

M3 - Journal article

AN - SCOPUS:77955228124

SN - 0022-0248

VL - 312

SP - 2093

EP - 2097

JO - Journal of Crystal Growth

JF - Journal of Crystal Growth

IS - 14

ER -