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Local Structural Properties in the Terahertz Semiconductor Zn 1-xCdxTe

  • Lawrence Berkeley National Laboratory

Research output: Contribution to journalJournal articlepeer-review

Abstract

Local structural properties of wide-band-gap semiconductors, Zn 1-xCdxTe (ZCT) crystals (x = 0-0.25), were studied using X-ray absorption fine structure (XAFS) measurements at the Te L1 - and Zn K-edges. A previous study by Liu et al.1) reported that ZCT emits or absorbs terahertz (THz) signals with a best efficiency when x ≃ 0.05. The XAFS studies show that the disorder and the bond length of Te-Zn pairs have maximum values at about x = 0.05. We discuss that these structural transitions are relevant to the efficiency of THz emission and absorption in ZCT crystals. We also find that the distance of Te-Cd pairs is at least ∼0. 2 Å longer than that of Te-Zn pairs and that Cd doping causes disorder/distortion in both Te and Zn sites in the crystals.

Original languageEnglish
Pages (from-to)6303-6307
Number of pages5
JournalJapanese Journal of Applied Physics
Volume42
Issue number10
DOIs
StatePublished - 2003.10

Keywords

  • Disorder
  • Local structure
  • Semiconductor
  • Terahertz
  • XAFS
  • ZnCdTe

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