Abstract
The local structure around Sn dopants in CeCoIn5-xSnx has been probed by extended X-ray absorption fine structure (EXAFS) technique. Our fit results for both x=0.12 and x=0.18 clearly indicate the dopant Sn atoms predominantly occupying the planar In(1) site. These results are consistent with the quasi-two-dimensional electronic properties of CeCoIn5 and will be discussed in relation to the observed bulk properties.
| Original language | English |
|---|---|
| Pages (from-to) | 401-403 |
| Number of pages | 3 |
| Journal | Physica B: Physics of Condensed Matter |
| Volume | 359-361 |
| Issue number | SPEC. ISS. |
| DOIs | |
| State | Published - 2005.04.30 |
Keywords
- Heavy-fermion compounds
- X-ray absorption spectroscopy
Quacquarelli Symonds(QS) Subject Topics
- Materials Science
- Engineering - Electrical & Electronic
- Engineering - Petroleum
- Physics & Astronomy
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