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Measurements of current spreading length and design of GaN-based light emitting diodes

  • Hyunsoo Kim*
  • , Jaehee Cho
  • , Jeong Wook Lee
  • , Sukho Yoon
  • , Hyungkun Kim*
  • , Cheolsoo Sone
  • , Yongjo Park
  • , Tae Yeon Seong
  • *Corresponding author for this work
  • Samsung
  • Korea University

Research output: Contribution to journalJournal articlepeer-review

Abstract

The authors report on the experimental method to measure the current spreading length in GaN-based light emitting diodes (LEDs) based on a one-dimensional current-distribution model neglecting vertical series resistance of the LEDs. It is clearly shown that the measured current spreading length is in good agreement with the calculated results, exhibiting a strong dependence on the injected current density (or forward bias voltage). LEDs fabricated with hybrid p -type reflectors by using the proposed design rule and measured current spreading lengths show enhancement of the output power by 10% as compared to LEDs made with standard reflectors.

Original languageEnglish
Article number063510
JournalApplied Physics Letters
Volume90
Issue number6
DOIs
StatePublished - 2007

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