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Method for determining the radiative efficiency of GaInN quantum wells based on the width of efficiency-versus-carrier-concentration curve

  • Guan Bo Lin*
  • , Qifeng Shan
  • , Andrew J. Birkel
  • , Jaehee Cho
  • , E. Fred Schubert
  • , Mary H. Crawford
  • , Karl R. Westlake
  • , Daniel D. Koleske
  • *Corresponding author for this work
  • Rensselaer Polytechnic Institute
  • Sandia National Laboratories, New Mexico

Research output: Contribution to journalJournal articlepeer-review

Abstract

We report a method to determine the radiative efficiency (RE) of a semiconductor by using room-temperature excitation-dependent photoluminescence measurements. Using the ABC model for describing the recombination of carriers, we show that the theoretical width of the RE-versus-carrier-concentration (n) curve is related to the peak RE. Since the normalized external quantum efficiency, EQEnormalized, is proportional to the RE, and the square root of the light-output power, √LOP, is proportional to n, the experimentally determined width of the √EQEnormalized-versus-n curve can be used to determine the RE. We demonstrate a peak RE of 91% for a Ga0.85In0.15N quantum well.

Original languageEnglish
Article number241104
JournalApplied Physics Letters
Volume101
Issue number24
DOIs
StatePublished - 2012.12.10

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