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Microscopic Analysis of Dynamic Loading-induced Fractures by Using Micro CT

  • Mitsuhiro Yokota*
  • , S. H. Cho
  • , M. Ito
  • , S. Owada
  • , K. Kaneko
  • *Corresponding author for this work
  • Hokkaido University
  • University of Toronto
  • Waseda University

Research output: Contribution to conferenceChapterpeer-review

Abstract

The purpose of this study is to reveal the mechanism of the high-voltage electric pulsed test. The artificial samples were tested by the high-voltage electric pulsed test. Toestimate the current path and analyze the fractures at grain boundaries, the samples were observed by using Micro CT, before and after the test. The fracture patterns were divided into 2 types, being the "multi fracture pattern" and the "single fracture pattern".

Original languageEnglish
Title of host publicationAdvances in X-ray Tomography for Geomaterials
PublisherWiley-ISTE
Pages237-243
Number of pages7
ISBN (Print)1905209606, 9781905209606
DOIs
StatePublished - 2010.01.22

Keywords

  • Fracture pattern
  • High-voltage pulses
  • Micro CT

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