Abstract
Microstructural details of rapidly solidified Al-20Si alloy powders by gas atomization were examined by transmission electron microscope. The as-atomized alloy powder consists of primary and eutectic Si embedded in Al matrix. Typical sizes of Al grain, primary Si and eutectic Si measured in the powder of 40 μm in diameter are 1μm and 100 nm, respectively. Twin and stacking faults were found to present in the precipitated Si. The alloy powder has semicoherently bonded interface between Al {1 1 1} and Si {1 1 1} with a specific lattice spacing.
| Original language | English |
|---|---|
| Pages (from-to) | 617-620 |
| Number of pages | 4 |
| Journal | Materials Science and Engineering: A |
| Volume | 304-306 |
| Issue number | 1-2 |
| DOIs | |
| State | Published - 2001.05.31 |
Keywords
- Crystallographic orientation
- Hypereutectic Al-Si alloys
- Rapid solidification
Quacquarelli Symonds(QS) Subject Topics
- Engineering - Mechanical
- Materials Science
- Physics & Astronomy
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