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Microstructure of rapidly solidified Al-20Si alloy powders

  • Taek Soo Kim*
  • , Byong Taek Lee
  • , Chul Ro Lee
  • , Byong Sun Chun
  • *Corresponding author for this work
  • Chungnam National University
  • Kongju National University

Research output: Contribution to journalJournal articlepeer-review

Abstract

Microstructural details of rapidly solidified Al-20Si alloy powders by gas atomization were examined by transmission electron microscope. The as-atomized alloy powder consists of primary and eutectic Si embedded in Al matrix. Typical sizes of Al grain, primary Si and eutectic Si measured in the powder of 40 μm in diameter are 1μm and 100 nm, respectively. Twin and stacking faults were found to present in the precipitated Si. The alloy powder has semicoherently bonded interface between Al {1 1 1} and Si {1 1 1} with a specific lattice spacing.

Original languageEnglish
Pages (from-to)617-620
Number of pages4
JournalMaterials Science and Engineering: A
Volume304-306
Issue number1-2
DOIs
StatePublished - 2001.05.31

Keywords

  • Crystallographic orientation
  • Hypereutectic Al-Si alloys
  • Rapid solidification

Quacquarelli Symonds(QS) Subject Topics

  • Engineering - Mechanical
  • Materials Science
  • Physics & Astronomy

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