Miniaturized negative group delay circuit using defected microstrip structure and lumped elements

Research output: Contribution to conferenceConference paperpeer-review

Abstract

In this paper, a design of miniaturized negative group delay circuit (NGDC) using U-shaped defected microstrip structure (DMS) and lumped elements is presented. The resonant center frequency and group delay (GD) time are controlled by an external capacitor and resistor connected across the DMS slot. To verify the design concept, a single stage NGDC is designed, fabricated and compared with the circuit simulation. To get wideband bandwidth of GD, two stages NGDC is also demonstrated and the GD of -7 ns with the maximum insertion loss of 34 dB was obtained over 60 MHz bandwidth.

Original languageEnglish
Title of host publication2013 IEEE MTT-S International Microwave Symposium Digest, MTT 2013
DOIs
StatePublished - 2013
Event2013 IEEE MTT-S International Microwave Symposium Digest, MTT 2013 - Seattle, WA, United States
Duration: 2013.06.22013.06.7

Publication series

NameIEEE MTT-S International Microwave Symposium Digest
ISSN (Print)0149-645X

Conference

Conference2013 IEEE MTT-S International Microwave Symposium Digest, MTT 2013
Country/TerritoryUnited States
CitySeattle, WA
Period13.06.213.06.7

Keywords

  • Defected microstrip structure
  • Distributed transmission line
  • Negative group delay
  • WCDMA

Quacquarelli Symonds(QS) Subject Topics

  • Engineering - Electrical & Electronic
  • Engineering - Petroleum
  • Physics & Astronomy

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