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Multi-frequency tapping-mode atomic force microscopy beyond three eigenmodes in ambient air

  • Santiago D. Solares*
  • , Sangmin An
  • , Christian J. Long
  • *Corresponding author for this work
  • University of Maryland, College Park
  • George Washington University
  • National Institute of Standards and Technology

Research output: Contribution to journalJournal articlepeer-review

Abstract

We present an exploratory study of multimodal tapping-mode atomic force microscopy driving more than three cantilever eigenmodes. We present tetramodal (4-eigenmode) imaging experiments conducted on a thin polytetrafluoroethylene (PTFE) film and computational simulations of pentamodal (5-eigenmode) cantilever dynamics and spectroscopy, focusing on the case of large amplitude ratios between the fundamental eigenmode and the higher eigenmodes. We discuss the dynamic complexities of the tip response in time and frequency space, as well as the average amplitude and phase response. We also illustrate typical images and spectroscopy curves and provide a very brief description of the observed contrast. Overall, our findings are promising in that they help to open the door to increasing sophistication and greater versatility in multi-frequency AFM through the incorporation of a larger number of driven eigenmodes, and in highlighting specific future research opportunities.

Original languageEnglish
Pages (from-to)1637-1648
Number of pages12
JournalBeilstein Journal of Nanotechnology
Volume5
Issue number1
DOIs
StatePublished - 2014

Keywords

  • Amplitude-modulation
  • Bimodal
  • Frequency-modulation
  • Multi-frequency atomic force microscopy
  • Multimodal
  • Open loop
  • Trimodal

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