Nanopipette combined with quartz tuning fork-atomic force microscope for force spectroscopy/microscopy and liquid delivery-based nanofabrication

Sangmin An; Kunyoung Lee; Bongsu Kim; Haneol Noh; Jongwoo Kim; Soyoung Kwon; Manhee Lee; Mun Heon Hong; Wonho Jhe

doi:10.1063/1.4866656

Nanopipette combined with quartz tuning fork-atomic force microscope for force spectroscopy/microscopy and liquid delivery-based nanofabrication

Sangmin An
, Kunyoung Lee
, Bongsu Kim
, Haneol Noh
, Jongwoo Kim
, Soyoung Kwon
, Manhee Lee
, Mun Heon Hong
, Wonho Jhe

Department of Physics

Seoul National University
National Institute of Standards and Technology
Samsung
LG Corporation

Research output: Contribution to journal › Journal article › peer-review

21 Scopus citations

Abstract

This paper introduces a nanopipette combined with a quartz tuning fork-atomic force microscope system (nanopipette/QTF-AFM), and describes experimental and theoretical investigations of the nanoscale materials used. The system offers several advantages over conventional cantilever-based AFM and QTF-AFM systems, including simple control of the quality factor based on the contact position of the QTF, easy variation of the effective tip diameter, electrical detection, on-demand delivery and patterning of various solutions, and in situ surface characterization after patterning. This tool enables nanoscale liquid delivery and nanofabrication processes without damaging the apex of the tip in various environments, and also offers force spectroscopy and microscopy capabilities.

Original language	English
Article number	033702
Journal	Review of Scientific Instruments
Volume	85
Issue number	3
DOIs	https://doi.org/10.1063/1.4866656
State	Published - 2014.03

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10.1063/1.4866656

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title = "Nanopipette combined with quartz tuning fork-atomic force microscope for force spectroscopy/microscopy and liquid delivery-based nanofabrication",

abstract = "This paper introduces a nanopipette combined with a quartz tuning fork-atomic force microscope system (nanopipette/QTF-AFM), and describes experimental and theoretical investigations of the nanoscale materials used. The system offers several advantages over conventional cantilever-based AFM and QTF-AFM systems, including simple control of the quality factor based on the contact position of the QTF, easy variation of the effective tip diameter, electrical detection, on-demand delivery and patterning of various solutions, and in situ surface characterization after patterning. This tool enables nanoscale liquid delivery and nanofabrication processes without damaging the apex of the tip in various environments, and also offers force spectroscopy and microscopy capabilities.",

author = "Sangmin An and Kunyoung Lee and Bongsu Kim and Haneol Noh and Jongwoo Kim and Soyoung Kwon and Manhee Lee and Hong, \{Mun Heon\} and Wonho Jhe",

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journal = "Review of Scientific Instruments",

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T1 - Nanopipette combined with quartz tuning fork-atomic force microscope for force spectroscopy/microscopy and liquid delivery-based nanofabrication

AU - An, Sangmin

AU - Lee, Kunyoung

AU - Kim, Bongsu

AU - Noh, Haneol

AU - Kim, Jongwoo

AU - Kwon, Soyoung

AU - Lee, Manhee

AU - Hong, Mun Heon

AU - Jhe, Wonho

PY - 2014/3

Y1 - 2014/3

N2 - This paper introduces a nanopipette combined with a quartz tuning fork-atomic force microscope system (nanopipette/QTF-AFM), and describes experimental and theoretical investigations of the nanoscale materials used. The system offers several advantages over conventional cantilever-based AFM and QTF-AFM systems, including simple control of the quality factor based on the contact position of the QTF, easy variation of the effective tip diameter, electrical detection, on-demand delivery and patterning of various solutions, and in situ surface characterization after patterning. This tool enables nanoscale liquid delivery and nanofabrication processes without damaging the apex of the tip in various environments, and also offers force spectroscopy and microscopy capabilities.

AB - This paper introduces a nanopipette combined with a quartz tuning fork-atomic force microscope system (nanopipette/QTF-AFM), and describes experimental and theoretical investigations of the nanoscale materials used. The system offers several advantages over conventional cantilever-based AFM and QTF-AFM systems, including simple control of the quality factor based on the contact position of the QTF, easy variation of the effective tip diameter, electrical detection, on-demand delivery and patterning of various solutions, and in situ surface characterization after patterning. This tool enables nanoscale liquid delivery and nanofabrication processes without damaging the apex of the tip in various environments, and also offers force spectroscopy and microscopy capabilities.

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U2 - 10.1063/1.4866656

DO - 10.1063/1.4866656

M3 - Journal article

C2 - 24689587

AN - SCOPUS:84900587943

SN - 0034-6748

VL - 85

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 3

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ER -

Nanopipette combined with quartz tuning fork-atomic force microscope for force spectroscopy/microscopy and liquid delivery-based nanofabrication

Abstract

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