Nanopipette/nanorod-combined quartz tuning fork-atomic force microscope

Sangmin An; Wonho Jhe

doi:10.3390/s19081794

Nanopipette/nanorod-combined quartz tuning fork-atomic force microscope

Sangmin An
, Wonho Jhe

Department of Physics

Seoul National University

Research output: Contribution to journal › Journal article › peer-review

9 Scopus citations

Abstract

We introduce a nanopipette/quartz tuning fork (QTF)-atomic force microscope (AFM) for nanolithography and a nanorod/QTF-AFM for nanoscratching with in situ detection of shear dynamics during performance. Capillary-condensed nanoscale water meniscus-mediated and electric field-assisted small-volume liquid ejection and nanolithography in ambient conditions are performed at a low bias voltage (~10 V) via a nanopipette/QTF-AFM. We produce and analyze Au nanoparticle-aggregated nanowire by using nanomeniscus-based particle stacking via a nanopipette/QTF-AFM. In addition, we perform a nanoscratching technique using in situ detection of the mechanical interactions of shear dynamics via a nanorod/QTF-AFM with force sensor capability and high sensitivity.

Original language	English
Article number	1794
Journal	Sensors
Volume	19
Issue number	8
DOIs	https://doi.org/10.3390/s19081794
State	Published - 2019.04.2

Keywords

Nanolithography
Nanopipette
Nanorod
Nanoscratching
QTF-AFM

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10.3390/s19081794

Cite this

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title = "Nanopipette/nanorod-combined quartz tuning fork-atomic force microscope",

abstract = "We introduce a nanopipette/quartz tuning fork (QTF)-atomic force microscope (AFM) for nanolithography and a nanorod/QTF-AFM for nanoscratching with in situ detection of shear dynamics during performance. Capillary-condensed nanoscale water meniscus-mediated and electric field-assisted small-volume liquid ejection and nanolithography in ambient conditions are performed at a low bias voltage (\textasciitilde{}10 V) via a nanopipette/QTF-AFM. We produce and analyze Au nanoparticle-aggregated nanowire by using nanomeniscus-based particle stacking via a nanopipette/QTF-AFM. In addition, we perform a nanoscratching technique using in situ detection of the mechanical interactions of shear dynamics via a nanorod/QTF-AFM with force sensor capability and high sensitivity.",

keywords = "Nanolithography, Nanopipette, Nanorod, Nanoscratching, QTF-AFM",

author = "Sangmin An and Wonho Jhe",

note = "Publisher Copyright: {\textcopyright} 2019 by the authors. Licensee MDPI, Basel, Switzerland.",

year = "2019",

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doi = "10.3390/s19081794",

language = "English",

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journal = "Sensors",

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TY - JOUR

T1 - Nanopipette/nanorod-combined quartz tuning fork-atomic force microscope

AU - An, Sangmin

AU - Jhe, Wonho

PY - 2019/4/2

Y1 - 2019/4/2

N2 - We introduce a nanopipette/quartz tuning fork (QTF)-atomic force microscope (AFM) for nanolithography and a nanorod/QTF-AFM for nanoscratching with in situ detection of shear dynamics during performance. Capillary-condensed nanoscale water meniscus-mediated and electric field-assisted small-volume liquid ejection and nanolithography in ambient conditions are performed at a low bias voltage (~10 V) via a nanopipette/QTF-AFM. We produce and analyze Au nanoparticle-aggregated nanowire by using nanomeniscus-based particle stacking via a nanopipette/QTF-AFM. In addition, we perform a nanoscratching technique using in situ detection of the mechanical interactions of shear dynamics via a nanorod/QTF-AFM with force sensor capability and high sensitivity.

AB - We introduce a nanopipette/quartz tuning fork (QTF)-atomic force microscope (AFM) for nanolithography and a nanorod/QTF-AFM for nanoscratching with in situ detection of shear dynamics during performance. Capillary-condensed nanoscale water meniscus-mediated and electric field-assisted small-volume liquid ejection and nanolithography in ambient conditions are performed at a low bias voltage (~10 V) via a nanopipette/QTF-AFM. We produce and analyze Au nanoparticle-aggregated nanowire by using nanomeniscus-based particle stacking via a nanopipette/QTF-AFM. In addition, we perform a nanoscratching technique using in situ detection of the mechanical interactions of shear dynamics via a nanorod/QTF-AFM with force sensor capability and high sensitivity.

KW - Nanolithography

KW - Nanopipette

KW - Nanorod

KW - Nanoscratching

KW - QTF-AFM

UR - https://www.scopus.com/pages/publications/85064988883

U2 - 10.3390/s19081794

DO - 10.3390/s19081794

M3 - Journal article

C2 - 30991660

AN - SCOPUS:85064988883

SN - 1424-8220

VL - 19

JO - Sensors

JF - Sensors

IS - 8

M1 - 1794

ER -

Nanopipette/nanorod-combined quartz tuning fork-atomic force microscope

Abstract

Keywords

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