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Nanoscale inspection of GaN LED devices using g(2) cathodoluminescence imaging

  • Toon Coenen
  • , Sophie Meuret
  • , Y. H. Ra
  • , Z. Mi
  • , Albert Polman
  • AMOLF
  • Delmic
  • McGill University
  • University of Michigan, Ann Arbor

Research output: Contribution to conferenceConference paperpeer-review

Abstract

We apply a combination of hyperspectral cathodoluminescence and g(2) imaging to bulk and nanostructured LED materials. From these measurements we extract both excited state lifetimes and the probability of excitation of a single primary electron.

Original languageEnglish
Title of host publicationCLEO
Subtitle of host publicationScience and Innovations, CLEO_SI 2019
PublisherOptica Publishing Group (formerly OSA)
ISBN (Print)9781943580576
DOIs
StatePublished - 2019
EventCLEO: Science and Innovations, CLEO_SI 2019 - San Jose, United States
Duration: 2019.05.52019.05.10

Publication series

NameOptics InfoBase Conference Papers
VolumePart F129-CLEO_SI 2019
ISSN (Electronic)2162-2701

Conference

ConferenceCLEO: Science and Innovations, CLEO_SI 2019
Country/TerritoryUnited States
CitySan Jose
Period19.05.519.05.10

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