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Nanoscale Inspection of GaN LED Devices Using g(2) Cathodoluminescence Imaging

  • Toon Coenen
  • , Sophie Meuret
  • , Y. H. Ra
  • , Z. Mi
  • , Albert Polman
  • AMOLF
  • Delmic
  • McGill University
  • University of Michigan, Ann Arbor

Research output: Contribution to conferenceConference paperpeer-review

Abstract

We apply a combination of hyperspectral cathodoluminescence and g(2)imaging to bulk and nanostructured LED materials. From these measurements we extract both excited state lifetimes and the probability of excitation of a single primary electron.

Original languageEnglish
Title of host publication2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781943580576
DOIs
StatePublished - 2019.05
Event2019 Conference on Lasers and Electro-Optics, CLEO 2019 - San Jose, United States
Duration: 2019.05.52019.05.10

Publication series

Name2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings

Conference

Conference2019 Conference on Lasers and Electro-Optics, CLEO 2019
Country/TerritoryUnited States
CitySan Jose
Period19.05.519.05.10

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