Skip to main navigation Skip to search Skip to main content

Negative Photoconductance in Heavily Doped Si Nanowire Field-Effect Transistors

  • Eunhye Baek
  • , Taiuk Rim
  • , Julian Schütt
  • , Chang Ki Baek
  • , Kihyun Kim
  • , Larysa Baraban*
  • , Gianaurelio Cuniberti
  • *Corresponding author for this work
  • Technische Universität Dresden
  • Pohang University of Science and Technology

Research output: Contribution to journalJournal articlepeer-review

Abstract

We report the first observation of negative photoconductance (NPC) in n- and p-doped Si nanowire field-effect transistors (FETs) and demonstrate the strong influence of doping concentrations on the nonconventional optical switching of the devices. Furthermore, we show that the NPC of Si nanowire FETs is dependent on the wavelength of visible light due to the phonon-assisted excitation to multiple conduction bands with different band gap energies that would be a distinct optoelectronic property of indirect band gap semiconductor. We attribute the main driving force of NPC in Si nanowire FETs to the photogenerated hot electrons trapping by dopants ions and interfacial states. Finally, comparing back- and top-gate modulation, we derive the mechanisms of the transition between negative and positive photoconductance regimes in nanowire devices. The transition is decided by the competition between the light-induced interfacial trapping and the recombination of mobile carriers, which is dependent on the light intensity and the doping concentration.

Original languageEnglish
Pages (from-to)6727-6734
Number of pages8
JournalNano Letters
Volume17
Issue number11
DOIs
StatePublished - 2017.11.8

Keywords

  • hot electron trapping
  • indirect band gap semiconductor
  • interfacial trapping
  • Negative photoconductance
  • Si nanowire

Fingerprint

Dive into the research topics of 'Negative Photoconductance in Heavily Doped Si Nanowire Field-Effect Transistors'. Together they form a unique fingerprint.

Cite this