@inproceedings{29ac7cd757e04832bb7d0f7570c92574,
title = "New analysis on the interface trap states at schottky contact",
abstract = "We present a simple equivalent circuit model that represents the charging dynamics of the interface states of Schottky diodes in the reverse bias condition. The interface trap states of an erbium-silicided Schottky diode are investigated from AC admittance measurement. The trap densities and the capture and emission transition times are extracted by using the equivalent circuit model.",
keywords = "Equivalent circuit modeling, Schottky diodes, Semiconductor-metal interfaces",
author = "Myungsim Jun and Moongyu Jang and Yarkyeon Kim and Cheljong Choi and Taeyoub Kim and Byungchul Park and Seongjae Lee",
year = "2007",
doi = "10.1063/1.2729800",
language = "English",
isbn = "9780735403970",
series = "AIP Conference Proceedings",
pages = "121--122",
booktitle = "Physics of Semiconductors - 28th International Conference on the Physics of Semiconductors, ICPS 2006, Part A and B",
note = "28th International Conference on the Physics of Semiconductors, ICPS 2006 ; Conference date: 24-07-2006 Through 28-07-2006",
}