Abstract
SiOx nanowire bunches were fabricated on a SiNx film with Au catalytic metal in the presence of an Ar flow of 50 sccm at 1150 °C. The resulting samples were characterized by field-emission scanning electron microscopy, transmission electron microscopy and energy dispersive X-ray spectroscopy. A SiNx film serves as a barrier to the diffusion of Si atoms from the Si substrate to the catalytic Au metal, where a substrate is a Si source material for SiOx nanowire (NW) growth. Using this process, we could temporally control the initial growth step of SiOx NWs and easily grow the NW bunch.
| Original language | English |
|---|---|
| Pages (from-to) | 3170-3172 |
| Number of pages | 3 |
| Journal | Physica E: Low-Dimensional Systems and Nanostructures |
| Volume | 40 |
| Issue number | 10 |
| DOIs | |
| State | Published - 2008.09 |
Keywords
- Amorphous Si nanowire
- Thermal chemical vapor deposition
- Transmission electron microscopy
Quacquarelli Symonds(QS) Subject Topics
- Materials Science
- Physics & Astronomy
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