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Next-Generation Variable Capacitors to Reduce Capacitance Variable Time Using SiC MOSFETs and p-i-n Diodes in 13.56-MHz RF Plasma Systems

  • Juhwa Min
  • , Beomseok Chae
  • , Yongsug Suh*
  • , Jinho Kim
  • , Hyunbae Kim
  • *Corresponding author for this work
  • Jeonbuk National University
  • Samsung

Research output: Contribution to journalJournal articlepeer-review

Abstract

This article introduces a novel method of reducing the capacitance variable time of a vacuum variable capacitor (VVC) impedance matching circuit of 320 V/1 kW/13.56 MHz common to radio frequency (RF) plasma systems. Our method replaces the VVC with an electrical variable capacitor (EVC) that uses power electronics technology to reduce capacitance variable time. Simulation and testing of the proposed circuit showed that the variable time of the EVC was maintained below $81~\mu \text{s}$ , and that due to the fast switching action of the power semiconductor switch, the proposed circuit can be applied in the impedance matching circuit of high-power and high-frequency RF plasma systems.

Original languageEnglish
Pages (from-to)1353-1362
Number of pages10
JournalIEEE Journal of Emerging and Selected Topics in Power Electronics
Volume10
Issue number2
DOIs
StatePublished - 2022.04.1

Keywords

  • Capacitance variable time
  • electrical variable capacitor (EVC)
  • p-i-n diode
  • radio frequency (RF) plasma systems
  • SiC MOSFETs

Quacquarelli Symonds(QS) Subject Topics

  • Engineering - Electrical & Electronic
  • Engineering - Petroleum

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