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Novel applications of intense pulsed ion beams in materials science

  • K. Yatsui*
  • , W. Jiang
  • , H. Suematsu
  • , F. Endo
  • , S. C. Yang
  • *Corresponding author for this work
  • Nagaoka University of Technology

Research output: Contribution to conferenceConference paperpeer-review

Abstract

Using pulsed ion beam evaporation technique, experimental studies were carried out to embed metals into via holes in LSI. It will be shown that tungsten is successfully embedded in via holes with the aspect ratio of 4.3. Furthermore, light emission of blue has been observed from a poly silicon nanosize powders, which is also produced by pulsed ion beam evaporation technique.

Original languageEnglish
Title of host publicationBEAMS 2002 - 14th International Conference on High-Power Particle Beams
PublisherIEEE Computer Society
Pages401-404
Number of pages4
ISBN (Print)9780735401075
DOIs
StatePublished - 2002
Event14th International Conference on High-Power Particle Beams, BEAMS 2002 and the 5th International Conference on Dense Z-Pinches, DZP 2002 - Albuquerque, NM, United States
Duration: 2002.06.232002.06.28

Publication series

NameBEAMS 2002 - 14th International Conference on High-Power Particle Beams
Volume1

Conference

Conference14th International Conference on High-Power Particle Beams, BEAMS 2002 and the 5th International Conference on Dense Z-Pinches, DZP 2002
Country/TerritoryUnited States
CityAlbuquerque, NM
Period02.06.2302.06.28

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