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Onset of the Efficiency Droop in GaInN Quantum Well Light-Emitting Diodes under Photoluminescence and Electroluminescence Excitation

  • Guan Bo Lin*
  • , E. Fred Schubert
  • , Jaehee Cho
  • , Jun Hyuk Park
  • , Jong Kyu Kim
  • *Corresponding author for this work
  • Rensselaer Polytechnic Institute
  • Pohang University of Science and Technology

Research output: Contribution to journalJournal articlepeer-review

Abstract

The efficiency of Ga0.87In0.13N/GaN single and multiple quantum well (QW) light-emitting diodes is investigated under photoluminescence (PL) and electroluminescence (EL) excitation. By measuring the laser spot area (knife-edge method) and the absorbance of the GaInN QW (transmittance/reflectance measurements), the PL excitation density can be converted to an equivalent EL excitation density. The EL efficiency droop-onset occurs at an excitation density of 2.08 × 1026 cm-3 s-1 (J = 10 A/cm2), whereas no PL efficiency droop is found for excitation densities as high as 3.11 × 1027 cm-3 s-1 (J = 149 A/cm2). Considering Shockley-Read-Hall, radiative, and Auger recombination and including carrier leakage shows that the EL efficiency droop is consistent with a reduction of injection efficiency.

Original languageEnglish
Pages (from-to)1013-1018
Number of pages6
JournalACS Photonics
Volume2
Issue number8
DOIs
StatePublished - 2015.08.19

Keywords

  • efficiency droop
  • light-emitting diode
  • nitride semiconductor
  • solid-state lighting

Quacquarelli Symonds(QS) Subject Topics

  • Materials Science
  • Engineering - Electrical & Electronic
  • Engineering - Petroleum
  • Physics & Astronomy
  • Biological Sciences

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