Abstract
The efficiency of Ga0.87In0.13N/GaN single and multiple quantum well (QW) light-emitting diodes is investigated under photoluminescence (PL) and electroluminescence (EL) excitation. By measuring the laser spot area (knife-edge method) and the absorbance of the GaInN QW (transmittance/reflectance measurements), the PL excitation density can be converted to an equivalent EL excitation density. The EL efficiency droop-onset occurs at an excitation density of 2.08 × 1026 cm-3 s-1 (J = 10 A/cm2), whereas no PL efficiency droop is found for excitation densities as high as 3.11 × 1027 cm-3 s-1 (J = 149 A/cm2). Considering Shockley-Read-Hall, radiative, and Auger recombination and including carrier leakage shows that the EL efficiency droop is consistent with a reduction of injection efficiency.
| Original language | English |
|---|---|
| Pages (from-to) | 1013-1018 |
| Number of pages | 6 |
| Journal | ACS Photonics |
| Volume | 2 |
| Issue number | 8 |
| DOIs | |
| State | Published - 2015.08.19 |
Keywords
- efficiency droop
- light-emitting diode
- nitride semiconductor
- solid-state lighting
Quacquarelli Symonds(QS) Subject Topics
- Materials Science
- Engineering - Electrical & Electronic
- Engineering - Petroleum
- Physics & Astronomy
- Biological Sciences
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