Optimized slit pattern with defect trap for the patterned vertical alignment liquid crystal cell

Dynamical behavior of the liquid crystal director on the slit of the patterned vertical alignment liquid crystal cell are very unstable because there is a strong competition of strain energy of liquid crystal director. In this paper, we proved a unit patterned vertical alignment cell with stable dynamic behaviors by using the defect trap structure experimentally. In addition, we also inspected electro-optical instability of the proposed patterned vertical alignment liquid crystal cell as functions of a width and a length of the slit pattern. As a result, we could optimize the slit pattern of the patterned vertical alignment liquid crystal cell with the defect trap.