TY - GEN
T1 - Optomechanical transducer-based nanocantilever for atomic force microscopy
AU - An, Sangmin
AU - Michels, Thomas
AU - Zou, Jie
AU - Westly, Daron A.
AU - Aksyuk, Vladimir A.
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/10/2
Y1 - 2015/10/2
N2 - Reducing cantilever sizes toward the nanoscale enables increased atomic force microscopy (AFM) speed while maintaining high image quality and avoiding sample damage. However downsizing below the optical diffraction limit strongly increases the readout noise to unacceptable levels for conventional far-field beam bouncing detection schemes. Here, we demonstrate fast-scanning AFM imaging with a cavity optomechanical transducer-based nano- cantilever with 2 MHz transduction bandwidth, 4 MHz resonance frequency, sub-picogram mass, 1 N/m stiffness, and 7 fm/Hz1/2 displacement sensitivity.
AB - Reducing cantilever sizes toward the nanoscale enables increased atomic force microscopy (AFM) speed while maintaining high image quality and avoiding sample damage. However downsizing below the optical diffraction limit strongly increases the readout noise to unacceptable levels for conventional far-field beam bouncing detection schemes. Here, we demonstrate fast-scanning AFM imaging with a cavity optomechanical transducer-based nano- cantilever with 2 MHz transduction bandwidth, 4 MHz resonance frequency, sub-picogram mass, 1 N/m stiffness, and 7 fm/Hz1/2 displacement sensitivity.
UR - https://www.scopus.com/pages/publications/84958568546
U2 - 10.1109/OMN.2015.7288864
DO - 10.1109/OMN.2015.7288864
M3 - Conference paper
AN - SCOPUS:84958568546
T3 - International Conference on Optical MEMS and Nanophotonics
BT - OMN 2015 Jerusalem - 2015 International Conference on Optical MEMS and Nanophotonics, Proceedings
PB - IEEE Computer Society
T2 - International Conference on Optical MEMS and Nanophotonics, OMN 2015
Y2 - 2 August 2015 through 5 August 2015
ER -