Orientation-dependent structural properties and growth mechanism of ZnO nanorods

  • H. J. Yu
  • , E. S. Jeong
  • , S. H. Park
  • , S. Y. Seo
  • , S. H. Kim
  • , S. W. Han*
  • *Corresponding author for this work

Research output: Contribution to conferenceConference paperpeer-review

Abstract

We present the local structural properties of ZnO nanorods studied by using extended x-ray absorption fine structure (EXAFS). Vertically aligned ZnO nanorods were fabricated on Al2O3 substrates by a catalyst free metal organic chemical vapor deposition (MOCVD). The polarized EXAFS measurements on the ZnO nanorods were performed at Zn K-edge. The polarized EXAFS study revealed that the nanorods had a wurtzite structure, and that there were substantial amount of structural disorders in Zn-O pairs in the beginning of the nanorod growth. The EXAFS measurements revealed that the orientation-dependent disorders of the Zn-O pairs were directly related to the growth mechanism and crystal quality of the ZnO nanorods.

Original languageEnglish
Title of host publicationSYNCHROTRON RADIATION INSTRUMENTATION
Subtitle of host publicationNinth International Conference on Synchrotron Radiation Instrumentation
Pages1865-1870
Number of pages6
DOIs
StatePublished - 2007
EventSYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation - Daegu, Korea, Republic of
Duration: 2006.05.282006.06.28

Publication series

NameAIP Conference Proceedings
Volume879
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

ConferenceSYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation
Country/TerritoryKorea, Republic of
CityDaegu
Period06.05.2806.06.28

Keywords

  • EXAFS
  • Growth mechanism
  • MOCVD
  • Nanorod
  • ZnO

Quacquarelli Symonds(QS) Subject Topics

  • Physics & Astronomy

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