Abstract
An effective wet chemical etching method for p-GaN is proposed based on the surface band bending of the semiconductor. The metal organic chemical vapour deposition (MOCVD) grown p-GaN was successfully etched by biasing the substrate below -3 V during photoenhanced electrochemical etching using KOH solution and Hg lamp illumination. The etch rate increased with increasing negative voltage and was as high as 2.1 μm/min at -10 V.
| Original language | English |
|---|---|
| Pages (from-to) | 88-90 |
| Number of pages | 3 |
| Journal | Electronics Letters |
| Volume | 36 |
| Issue number | 1 |
| DOIs | |
| State | Published - 2000.01.6 |
Quacquarelli Symonds(QS) Subject Topics
- Engineering - Electrical & Electronic
- Engineering - Petroleum
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