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Photoluminescence of silicon quantum dots in silicon nitride grown by NH3 and SiH4

  • Baek Hyun Kim
  • , Chang Hee Cho
  • , Tae Wook Kim
  • , Nae Man Park
  • , Gun Yong Sung
  • , Seong Ju Park*
  • *Corresponding author for this work
  • Gwangju Institute of Science and Technology
  • Electronics and Telecommunications Research Institute

Research output: Contribution to journalJournal articlepeer-review

Abstract

The photoluminescence (PL) property of crystalline silicon quantum dots (Si QDs) in silicon nitride grown by using ammonia and silane gases is reported. The peak position of PL could be controlled in the wavelength range from 450 to 700 nm by adjusting the flow rates of ammonia and silane gases. The PL intensity of Si QDs grown by ammonia was more intense compared to that of Si QDs grown by nitrogen gas. To investigate the role of hydrogen in the PL enhancement, the Si QDs grown by nitrogen gas were postannealed under hydrogen ambient. The enhancement in PL intensity was attributed to the hydrogen passivation of dangling bonds related to silicon and/or nitrogen at the interface of Si QDs and silicon nitride.

Original languageEnglish
Article number091908
Pages (from-to)1-3
Number of pages3
JournalApplied Physics Letters
Volume86
Issue number9
DOIs
StatePublished - 2005.02.28

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