Photoluminescent properties of CdxZn1-xO thin films prepared by sol-gel spin-coating method

  • Hyunggil Park
  • , Giwoong Nam
  • , Hyunsik Yoon
  • , Jin Soo Kim
  • , Jeong Sik Son
  • , Jae Young Leem*
  • *Corresponding author for this work

Research output: Contribution to journalJournal articlepeer-review

Abstract

CdxZn1-xO thin films were prepared on Si (100) substrates by the sol-gel spin coating method. Temperaturedependent photoluminescence (PL) measurements were carried out to investigate the luminescent properties of the CdxZn1-xO thin films. The PL peaks of the CdxZn1-xO thin films decrease as the Cd concentration increases and the near-band edge emission (NBE) PL peaks of the CdxZn1-xO thin films are shifted toward the red region. In the temperature-dependent PL measurement, three components at 2.855, 3.038, and 3.148 eV in the PL emission peak of the Cd0.2Zn0.8O thin films were observed at 12 K. With increasing temperature, the emission peak at 3.148 eV at 12 K becomes red-shifted and the monotonic PL peak at 12 K divides into three clear peaks as the temperature increases. The activation energy for the 3.148 eV peak is 69.54 meV corresponding to the energy for the frozen-out donors.

Original languageEnglish
Pages (from-to)497-500
Number of pages4
JournalElectronic Materials Letters
Volume9
Issue number4
DOIs
StatePublished - 2013.07

Keywords

  • CdZnO
  • photoluminescence
  • sol-gel
  • X-ray diffraction

Quacquarelli Symonds(QS) Subject Topics

  • Materials Science

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