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Predictive estimation of vacuum ultraviolet emission intensity in a low-pressure inductively coupled hydrogen plasma based on the branching ratio technique

  • Jonggu Han
  • , Woojin Park
  • , Jongsik Kim
  • , Duksun Han
  • , Kyunghun Han
  • , Chansoo Kang
  • , Se Youn Moon*
  • *Corresponding author for this work
  • Jeonbuk National University
  • National Fusion Research Institute
  • Samsung

Research output: Contribution to journalJournal articlepeer-review

Abstract

Vacuum ultraviolet (VUV) emission has recently attracted attention in low pressure processing plasmas because of the possibility of high-energy photon damages on the substrates. To quantify the VUV induced damages during the plasma processes, it is need to use of a VUV spectrometer equipped with vacuum systems not readily available in industries. In this work, therefore, we report a simple method to estimate the VUV emission intensity of hydrogen plasmas utilizing a conventional visible spectrometer widely used in plasma processes. From the measurement of hydrogen emission spectra in the visible wavelength region, the VUV emission line (Lyman-β) was calculated using the branching ratio technique and enabled the estimation of Lyman-α emission intensity based on the Boltzmann relation with given plasma parameters. In addition, it was found that the method could also predict the VUV emission intensity for high density hydrogen plasma cases by considering the self-absorption effect by hydrogen atoms.

Original languageEnglish
Pages (from-to)208-213
Number of pages6
JournalCurrent Applied Physics
Volume31
DOIs
StatePublished - 2021.11

Keywords

  • Branching ratio technique
  • Hydrogen plasma emission
  • Plasma photon damage
  • Plasma spectroscopy
  • Vacuum ultraviolet emission

Quacquarelli Symonds(QS) Subject Topics

  • Materials Science
  • Physics & Astronomy

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