Skip to main navigation Skip to search Skip to main content

Preparation of polycrystalline silicon thin films by pulsed ion-beam evaporation

  • Nagaoka University of Technology
  • Meidensha Corporation

Research output: Contribution to conferenceConference paperpeer-review

Abstract

By intense pulsed ion beam evaporation, we have succeeded in the preparation of polycrystaltine silicon thin films on silicon substrate. High crystallinity and deposition rate have been achieved without heating the substrate. The crystallinity of poly-Si film has been improved with increasing the density of the ablation plasma, where the grain size of the film has been found to be much smaller. To enhance the crystallinity and density of poly-Si thin film, bias voltage was applied to the substrate, where the quality of poly-Si film has been improved by the ion bombardment.

Original languageEnglish
Title of host publicationPPPS 2001 - Pulsed Power Plasma Science 2001
EditorsRobert Reinovsky, Mark Newton
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1842-1845
Number of pages4
ISBN (Electronic)0780371208, 9780780371200
DOIs
StatePublished - 2001
Event28th IEEE International Conference on Plasma Science and 13th IEEE International Pulsed Power Conference, PPPS 2001 - Las Vegas, United States
Duration: 2001.06.172001.06.22

Publication series

NamePPPS 2001 - Pulsed Power Plasma Science 2001
Volume2

Conference

Conference28th IEEE International Conference on Plasma Science and 13th IEEE International Pulsed Power Conference, PPPS 2001
Country/TerritoryUnited States
CityLas Vegas
Period01.06.1701.06.22

Fingerprint

Dive into the research topics of 'Preparation of polycrystalline silicon thin films by pulsed ion-beam evaporation'. Together they form a unique fingerprint.

Cite this