Quantitative Analysis of Trap Behaviors for Deuterium Annealing Effect on IGZO TFTs by TCAD and Experimental Characterization
- Hyeonjun Song
- , Soon Joo Yoon
- , Jaewook Yoo
- , Seongbin Lim
- , Ja Yun Ku
- , Tae Hyun Kil
- , Hongseung Lee
- , Jo Hak Jeong
- , Soyeon Kim
- , Moon Kwon Lee
- , Hyeon Sik Jang
- , Kiyoung Lee
- , Keun Heo
- , Jun Young Park
- , Yoon Kyeung Lee*
- , Hagyoul Bae*
*Corresponding author for this work
- Jeonbuk National University
- Chungbuk National University
- Hongik University
Research output: Contribution to journal › Journal article › peer-review
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