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Radius of curvature measurement of spherical smooth surfaces by multiple-beam interferometry in reflection

  • D. G. Abdelsalam
  • , M. S. Shaalan
  • , M. M. Eloker
  • , Daesuk Kim*
  • *Corresponding author for this work
  • National Institute of Standards
  • Al-Azhar University

Research output: Contribution to journalJournal articlepeer-review

Abstract

In this paper a method is presented to accurately measure the radius of curvature of different types of curved surfaces of different radii of curvatures of 38 000,18 000 and 8000 mm using multiple-beam interference fringes in reflection. The images captured by the digital detector were corrected by flat fielding method. The corrected images were analyzed and the form of the surfaces was obtained. A 3D profile for the three types of surfaces was obtained using Zernike polynomial fitting. Some sources of uncertainty in measurement were calculated by means of ray tracing simulations and the uncertainty budget was estimated within λ/40.

Original languageEnglish
Pages (from-to)643-649
Number of pages7
JournalOptics and Lasers in Engineering
Volume48
Issue number6
DOIs
StatePublished - 2010.06

Keywords

  • Curved surfaces
  • Flat fielding
  • Multiple-beam
  • Ray tracing
  • Zernike Polynomial

Quacquarelli Symonds(QS) Subject Topics

  • Engineering - Mechanical
  • Materials Science
  • Engineering - Electrical & Electronic
  • Engineering - Petroleum
  • Physics & Astronomy

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