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Reduction of operation voltage in GaN-based light-emitting diode utilizing a Si δ-doped n-GaN contact layer

  • Seong Ran Jeon
  • , Myong Soo Cho
  • , Tran Vinh Hung
  • , Min A. Yu
  • , Gye Mo Yang*
  • *Corresponding author for this work
  • Jeonbuk National University

Research output: Contribution to journalJournal articlepeer-review

Abstract

We have investigated the characteristics of InGaN/GaN blue light-emittg diodes (LEDs) with a Si delta (δ)-doped GaN contact layer. The Si δ-doping could enhance the Si doping concentration and improve the lateral conductivity in the GaN:Si contact layer without cracking. The operation voltage and dynamic resistance of LEDs with a Si δ-doped GaN contact layer were 3.65 Ω and 27.0 Ω at 20 mA, respectively. Meanwhile, the operation voltage and dynamic resistance of conventional LEDs with a uniformly doped GaN:Si contact layer were 3.94 V and 32.3 Ω at 20 mA, respectively. The operation voltage reduction might be related to the high Si concentration and improvement of crystalline quality due to the Si δ-doping into the contact layer. In addition, the light emission efficiency was improved by the Si δ-doping in the n-GaN contact layer.

Original languageEnglish
Pages (from-to)L761-L764
JournalJapanese Journal of Applied Physics
Volume41
Issue number7 A
DOIs
StatePublished - 2002.07.1

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

  1. SDG 7 - Affordable and Clean Energy
    SDG 7 Affordable and Clean Energy

Keywords

  • GaN
  • Leakage current
  • LEDs
  • Operation voltage
  • Si δ-doping
  • Threading dislocation

Quacquarelli Symonds(QS) Subject Topics

  • Physics & Astronomy

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