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Resistive switching characteristics of ZnO-graphene quantum dots and their use as an active component of an organic memory cell with one diode-one resistor architecture

  • Yongsung Ji
  • , Sang A. Lee
  • , An Na Cha
  • , Munju Goh
  • , Sukang Bae
  • , Sanghyun Lee
  • , Dong Ick Son
  • , Tae Wook Kim*
  • *Corresponding author for this work
  • Korea Institute of Science and Technology
  • Rice University
  • Jeonbuk National University

Research output: Contribution to journalJournal articlepeer-review

Abstract

We investigated the resistive switching characteristics of a polystyrene:ZnO-graphene quantum dots system and its potential application in a one diode-one resistor architecture of an organic memory cell. The log-log I-V plot and the temperature-variable I-V measurements revealed that the switching mechanism in a low-current state is closely related to thermally activated transport. The turn-on process was induced by a space-charge-limited current mechanism resulted from the ZnO-graphene quantum dots acting as charge trap sites, and charge transfer through filamentary path. The memory device with a diode presented a ∼103 ION/IOFF ratio, stable endurance cycles (102 cycles) and retention times (104 s), and uniform cell-to-cell switching. The one diode-one resistor architecture can effectively reduce cross-talk issue and realize a cross bar array as large as ∼3 kbit in the readout margin estimation. Furthermore, a specific word was encoded using the standard ASCII character code.

Original languageEnglish
Pages (from-to)77-83
Number of pages7
JournalOrganic Electronics
Volume18
DOIs
StatePublished - 2015.03

Keywords

  • Nonvolatile memory
  • One diode-one resistor architecture
  • Organic resistive memory
  • ZnO-Graphene quantum dot

Quacquarelli Symonds(QS) Subject Topics

  • Materials Science
  • Engineering - Electrical & Electronic
  • Engineering - Petroleum
  • Chemistry
  • Physics & Astronomy

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