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Selective adsorption of benzoic acid species on patterned OH/Si(100) surface

  • Kyuwook Ihm
  • , Jin Hee Han
  • , Bongsoo Kim
  • , Sukmin Chung*
  • , Chan Cuk Hwang
  • , Tai Hee Kang
  • , Ki Jeong Kim
  • , Yu Jin Jung
  • , Ki Seok An
  • *Corresponding author for this work
  • Pohang University of Science and Technology
  • Pohang Accelerator Laboratory
  • Center for Integrated Molecular Systems
  • Korea Research Institute of Chemical Technology

Research output: Contribution to journalJournal articlepeer-review

Abstract

It has recently been observed that benzoic acid strongly reacts with OH group on the silicon surface. Here, by defining the area in which OH group is adsorbed on the Si surface, the selective adsorption of benzoic acid species was attempted. The patterned OH/Si surface was prepared by irradiating the zeroth order beam from the bending magnet of the synchrotron facility through the gold mesh placed in front of the OH/Si sample. For discerning the selectively adsorbed molecule by x-ray photoelectron emission microscopy (X-PEEM) at N k edge, 4-nitrobenzoic acid was utilized instead of benzoic acid. Near edge x-ray absorption fine structure spectra at carbon and oxygen k edges were in good accord with the previous results obtained from the benzoic acid system. The X-PEEM images around N k edge clearly showed that the molecules adsorb only on the area in which OH groups remain.

Original languageEnglish
Article number043510
JournalJournal of Applied Physics
Volume100
Issue number4
DOIs
StatePublished - 2006

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