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Silicon MEMS acceleration switch with high reliability using hooked latch

  • Yeonsu Lee
  • , Sung Min Sim
  • , Hyunseok Kim
  • , Yong Kweon Kim
  • , Jung Mu Kim*
  • *Corresponding author for this work
  • Jeonbuk National University
  • Seoul National University

Research output: Contribution to journalJournal articlepeer-review

Abstract

In this study, a MEMS acceleration switch using mechanical hooked latch is designed, fabricated, and measured. A mechanical latching mechanism and switching characteristic are analyzed using FEM simulation. The acceleration switch with a size of 1.8 × 3.2 × 0.55 mm3 was fabricated using a Silicon-on-Glass (SiOG) process. A resonance frequency of the fabricated switch and an acceleration threshold are measured to be 1.022 kHz and 43.7 g, respectively. The fabricated switch is latched when an applied external acceleration is higher than the threshold value of 43.7 g. After latching "on", the "on" state of the switch is reliably sustained regardless of the applied external acceleration.

Original languageEnglish
Pages (from-to)10-19
Number of pages10
JournalMicroelectronic Engineering
Volume152
DOIs
StatePublished - 2016.02.20

Keywords

  • Acceleration threshold
  • Chattering phenomenon
  • Inertial measurement unit
  • Mechanical latch
  • MEMS acceleration switch

Quacquarelli Symonds(QS) Subject Topics

  • Materials Science
  • Engineering - Electrical & Electronic
  • Engineering - Petroleum
  • Physics & Astronomy

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