Abstract
We describe what we believe to be a new digital holographic configuration that can be utilized for both single-shot, dual-wavelength, off-axis geometry and imaging polarimetry. To get the feasibility of the single-shot, dual-wavelength, off-axis geometry, a sample with a nominal step height of 1.34μm is used. Undesirable noises that strongly affect the measurement have been suppressed successfully by using a modified flat fielding method for the dual-wavelength scheme. And also, the experiment is conductedon a nanopattern sample on the basis of a single image acquisition to show the imaging polarimetry capability. The proposed scheme can provide a real-time solution for measuring three-dimensional objects having a high abrupt height difference with moderate accuracy. Furthermore, it can be used as a fast polarization imaging measurement tool.
| Original language | English |
|---|---|
| Pages (from-to) | 3360-3368 |
| Number of pages | 9 |
| Journal | Applied Optics |
| Volume | 50 |
| Issue number | 19 |
| DOIs | |
| State | Published - 2011.07.1 |
Quacquarelli Symonds(QS) Subject Topics
- Engineering - Electrical & Electronic
- Engineering - Petroleum
- Physics & Astronomy
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