Abstract
This paper describes a highly robust snapshot imaging polarimetry based on structured interference fringes. The proposed new concept on snapshot imaging polarimetry can provide dynamic measurement capability with high robustness and design flexibility. We demonstrate the proposed simple scheme can provide a spatially resolved polarimetric phase map Δ(x,y) in tens of milliseconds with high precision.
| Original language | English |
|---|---|
| Article number | OPTM-6-02 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 11142 |
| State | Published - 2019 |
| Event | Optical Technology and Measurement for Industrial Applications Conference 2019 - Yokohama, Japan Duration: 2019.04.22 → 2019.04.26 |
Keywords
- imaging polarimetry
- phase extraction
- snapshot
- structured fringe
Quacquarelli Symonds(QS) Subject Topics
- Materials Science
- Computer Science & Information Systems
- Mathematics
- Engineering - Electrical & Electronic
- Engineering - Petroleum
- Data Science
- Physics & Astronomy
Fingerprint
Dive into the research topics of 'Snapshot imaging polarimetry based on structured interference fringes'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver