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Solid incorporation of AlGaN and influence of growth interruption on GaN/AlGaN quantum well structures grown by MOCVD

  • S. C. Choi*
  • , J. H. Kim
  • , J. Y. Choi
  • , G. M. Yang
  • *Corresponding author for this work
  • Jeonbuk National University

Research output: Contribution to journalConference articlepeer-review

Abstract

The AlGaN alloys and GaN/Al0.16Ga0.84N single quantum well structures have been grown on (0001) sapphire substrate by metalorganic chemical vapor deposition (MOCVD) with growth condition varied. Both the Al composition and the growth rate of AlGaN are strongly affected by gas-phase parasitic reaction between ammonia and TMA1. We achieved a high Hall mobility of 270 cm2/Vs at room temperature in Al0.075Ga0.925N grown under the optimum source flow rate. In addition, the influence of growth interruption on the optical quality of GaN/AlGaN single quantum well (QW) structures was studied to realize high-quality QWs. Photoluminescence measurements revealed that the emission peak is blue-shifted as the interruption time increases and the emission intensity is maximized at a second short interruption time.

Original languageEnglish
Pages (from-to)263-267
Number of pages5
JournalPhysica Status Solidi (A) Applied Research
Volume176
Issue number1
DOIs
StatePublished - 1999.11
EventProceedings of the 1999 3rd International Conference on Nitride Semiconductors (ICNS'99) - Montpellier, France
Duration: 1999.07.41999.07.9

Quacquarelli Symonds(QS) Subject Topics

  • Materials Science
  • Physics & Astronomy

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