Spin-dependent Coulomb blockade in a silicon-on-insulator-based single-electron transistor

We report low-temperature conductance measurement on a Coulomb-blockaded dot in a silicon-on-insulator-based single-electron transistor with in-plane side gates. The linear conductance for 4.2 K at zero magnetic field exhibits up to three paired peaks, indicating simple alternating odd (spin 1/2)-even(spin 0) filling. Three intrapair spacings are found to be nearly a constant value, corresponding to the single charging energy U, whereas two interpair spacings are different which are associated with (U+ΔE₁ and U+ΔE₂, i.e., successive quantized level spacings added to U. The quantized level spacings were also revealed in the nonlinear current staircases.