Abstract
Remarkably strong emission of terahertz radiation from illuminated GaAs microstructures on a Si substrate is reported. The peak-to-peak amplitude of terahertz radiation from the sample is 9 times larger than that of THz radiation from a semi-insulating GaAs wafer. The spectral width of the sample is larger than that of a semi-insulating GaAs wafer; in particular, the spectral amplitude increases at higher frequencies. The presented GaAs microstructures on a Si substrate can be suitable for practical and efficient THz sources required in various THz applications.
| Original language | English |
|---|---|
| Article number | 125027 |
| Journal | AIP Advances |
| Volume | 8 |
| Issue number | 12 |
| DOIs | |
| State | Published - 2018.12.1 |
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