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Strong enhancement of flux pinning in YBa2Cu3O 7-δ multilayers with columnar defects comprised of self-assembled BaZrO3 nanodots

  • S. Kang*
  • , K. J. Leonard
  • , P. M. Martin
  • , J. Li
  • , A. Goyal
  • *Corresponding author for this work
  • Oak Ridge National Laboratory

Research output: Contribution to journalJournal articlepeer-review

Abstract

Multilayer structures comprising YBa2Cu3O 7-δ (YBCO) films with columns of self-assembled BaZrO 3 (BZO) nanodots with interlayers of CeO2 or pure YBa 2Cu3O7-δ were grown on rolling-assisted biaxially textured substrates (RABiTSs) using pulsed laser deposition. A significant enhancement of the critical current density (Jc) was observed for the multilayers compared with a single layer of YBCO + BZO. J c varies as Jc∼H with α of 0.27 for single layer of YBCO + BZO and 0.34 for both multilayered films. Enhancement of pinning in the multilayers is attributed to the presence of columnar defects comprised of self-assembled nanodots of BZO as well as planar CuO-type stacking defects arising as a result of interfacial reactions in the multilayers.

Original languageEnglish
Article number003
Pages (from-to)11-15
Number of pages5
JournalSuperconductor Science and Technology
Volume20
Issue number1
DOIs
StatePublished - 2007.01.1

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