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Structural and electrical characterization of intrinsic n-type In2O3 nanowires

  • Gunho Jo
  • , Woong Ki Hong
  • , Jongsun Maeng
  • , Tae Wook Kim
  • , Gunuk Wang
  • , Ahnsook Yoon
  • , Soon Shin Kwon
  • , Sunghoon Song
  • , Takhee Lee*
  • *Corresponding author for this work
  • Gwangju Institute of Science and Technology

Research output: Contribution to journalJournal articlepeer-review

Abstract

We synthesized high-quality single-crystalline indium oxide nanowires using gold catalytic vapor-liquid-solid growth and characterized their electrical properties with field effect transistor structures. The grown indium oxide nanowires are non-stoichiometric with In:O composition ratio of 1:1.24 due to oxygen vacancies from X-ray photoelectron spectroscopic study. These oxygen vacancies act as donors in indium oxide nanowires. The field effect transistors based on these nanowires exhibited good transistor characteristics with well-defined linear and saturation regions with on/off ratios as high as 3 × 104 at drain bias 0.1 V, electron carrier density of 3.7 × 1017 cm-3 and an electron mobility of 85 cm2/V s.

Original languageEnglish
Pages (from-to)308-311
Number of pages4
JournalColloids and Surfaces A: Physicochemical and Engineering Aspects
Volume313-314
DOIs
StatePublished - 2008.02.1

Keywords

  • Field effect transistor
  • Indium oxide
  • Nanoelectronics
  • Nanowire

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