Abstract
We synthesized high-quality single-crystalline indium oxide nanowires using gold catalytic vapor-liquid-solid growth and characterized their electrical properties with field effect transistor structures. The grown indium oxide nanowires are non-stoichiometric with In:O composition ratio of 1:1.24 due to oxygen vacancies from X-ray photoelectron spectroscopic study. These oxygen vacancies act as donors in indium oxide nanowires. The field effect transistors based on these nanowires exhibited good transistor characteristics with well-defined linear and saturation regions with on/off ratios as high as 3 × 104 at drain bias 0.1 V, electron carrier density of 3.7 × 1017 cm-3 and an electron mobility of 85 cm2/V s.
| Original language | English |
|---|---|
| Pages (from-to) | 308-311 |
| Number of pages | 4 |
| Journal | Colloids and Surfaces A: Physicochemical and Engineering Aspects |
| Volume | 313-314 |
| DOIs | |
| State | Published - 2008.02.1 |
Keywords
- Field effect transistor
- Indium oxide
- Nanoelectronics
- Nanowire
Fingerprint
Dive into the research topics of 'Structural and electrical characterization of intrinsic n-type In2O3 nanowires'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver