Structural and magnetic properties of Zn1-xFexO thin films synthesized by RF magnetron sputtering

S. Y. Seo; C. H. Kwak; Y. B. Lee; S. H. Kim; S. H. Park; S. W. Han

doi:10.3938/jkps.52.805

Structural and magnetic properties of Zn_1-xFe_xO thin films synthesized by RF magnetron sputtering

S. Y. Seo^*
, C. H. Kwak
, Y. B. Lee
, S. H. Kim
, S. H. Park
, S. W. Han

^*Corresponding author for this work

Physics Education

Pohang University of Science and Technology
Research Institute of Industrial Science & Technology, Pohang

Research output: Contribution to journal › Journal article › peer-review

13 Scopus citations

Abstract

This study reports the structural and the magnetic properties of Zn _1-xFe_xO (ZnFeO) films with Fe composition ratios of 0.03-0.07. High-quality Zn_1-xFe_xO thin films with a mean thickness of 500 nm were fabricated on α-sapphire (0001) substrates by RF magnetron sputtering. The structures of the ZnFeO thin films were examined using various techniques. X-ray diffraction revealed the films to have a well-ordered wurtzite structure without any extra phases. However, the ZnO (0002) diffraction peak shifted gradually from 20θ = 34.378° to 34.142° with increasing Fe concentration from 0.03 to 0.07. This corresponds to a lattice constant increase of 0.035 A. X-ray photoelectron spectroscopy (XPS) measurements were employed to characterize the valence state of the Fe ions in the films. The XPS revealed the coexistence of Fe³⁺ and Fe ²⁺ ions in the films. The DC-magnetization measurements demonstrated that the ZnFeO films were ferromagnetic at 5 K.

Original language	English
Pages (from-to)	805-809
Number of pages	5
Journal	Journal of the Korean Physical Society
Volume	52
Issue number	3 PART 1
DOIs	https://doi.org/10.3938/jkps.52.805
State	Published - 2008.03

Keywords

DMS
Ferromagnetic
Film
Sputtering
ZnFeO

Quacquarelli Symonds(QS) Subject Topics

Physics & Astronomy

Access to Document

10.3938/jkps.52.805

Cite this

@article{7ee070efc74b434d93394dd36d9c98f6,

title = "Structural and magnetic properties of Zn1-xFexO thin films synthesized by RF magnetron sputtering",

abstract = "This study reports the structural and the magnetic properties of Zn 1-xFexO (ZnFeO) films with Fe composition ratios of 0.03-0.07. High-quality Zn1-xFexO thin films with a mean thickness of 500 nm were fabricated on α-sapphire (0001) substrates by RF magnetron sputtering. The structures of the ZnFeO thin films were examined using various techniques. X-ray diffraction revealed the films to have a well-ordered wurtzite structure without any extra phases. However, the ZnO (0002) diffraction peak shifted gradually from 20θ = 34.378° to 34.142° with increasing Fe concentration from 0.03 to 0.07. This corresponds to a lattice constant increase of 0.035 A. X-ray photoelectron spectroscopy (XPS) measurements were employed to characterize the valence state of the Fe ions in the films. The XPS revealed the coexistence of Fe3+ and Fe 2+ ions in the films. The DC-magnetization measurements demonstrated that the ZnFeO films were ferromagnetic at 5 K.",

keywords = "DMS, Ferromagnetic, Film, Sputtering, ZnFeO",

author = "Seo, \{S. Y.\} and Kwak, \{C. H.\} and Lee, \{Y. B.\} and Kim, \{S. H.\} and Park, \{S. H.\} and Han, \{S. W.\}",

year = "2008",

month = mar,

doi = "10.3938/jkps.52.805",

language = "English",

volume = "52",

pages = "805--809",

journal = "Journal of the Korean Physical Society",

issn = "0374-4884",

number = "3 PART 1",

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TY - JOUR

T1 - Structural and magnetic properties of Zn1-xFexO thin films synthesized by RF magnetron sputtering

AU - Seo, S. Y.

AU - Kwak, C. H.

AU - Lee, Y. B.

AU - Kim, S. H.

AU - Park, S. H.

AU - Han, S. W.

PY - 2008/3

Y1 - 2008/3

N2 - This study reports the structural and the magnetic properties of Zn 1-xFexO (ZnFeO) films with Fe composition ratios of 0.03-0.07. High-quality Zn1-xFexO thin films with a mean thickness of 500 nm were fabricated on α-sapphire (0001) substrates by RF magnetron sputtering. The structures of the ZnFeO thin films were examined using various techniques. X-ray diffraction revealed the films to have a well-ordered wurtzite structure without any extra phases. However, the ZnO (0002) diffraction peak shifted gradually from 20θ = 34.378° to 34.142° with increasing Fe concentration from 0.03 to 0.07. This corresponds to a lattice constant increase of 0.035 A. X-ray photoelectron spectroscopy (XPS) measurements were employed to characterize the valence state of the Fe ions in the films. The XPS revealed the coexistence of Fe3+ and Fe 2+ ions in the films. The DC-magnetization measurements demonstrated that the ZnFeO films were ferromagnetic at 5 K.

AB - This study reports the structural and the magnetic properties of Zn 1-xFexO (ZnFeO) films with Fe composition ratios of 0.03-0.07. High-quality Zn1-xFexO thin films with a mean thickness of 500 nm were fabricated on α-sapphire (0001) substrates by RF magnetron sputtering. The structures of the ZnFeO thin films were examined using various techniques. X-ray diffraction revealed the films to have a well-ordered wurtzite structure without any extra phases. However, the ZnO (0002) diffraction peak shifted gradually from 20θ = 34.378° to 34.142° with increasing Fe concentration from 0.03 to 0.07. This corresponds to a lattice constant increase of 0.035 A. X-ray photoelectron spectroscopy (XPS) measurements were employed to characterize the valence state of the Fe ions in the films. The XPS revealed the coexistence of Fe3+ and Fe 2+ ions in the films. The DC-magnetization measurements demonstrated that the ZnFeO films were ferromagnetic at 5 K.

KW - DMS

KW - Ferromagnetic

KW - Film

KW - Sputtering

KW - ZnFeO

UR - https://www.scopus.com/pages/publications/41949113608

U2 - 10.3938/jkps.52.805

DO - 10.3938/jkps.52.805

M3 - Journal article

AN - SCOPUS:41949113608

SN - 0374-4884

VL - 52

SP - 805

EP - 809

JO - Journal of the Korean Physical Society

JF - Journal of the Korean Physical Society

IS - 3 PART 1

ER -