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Structural, optical and electrical properties of nitrogen ion implanted ZnO nanorods

  • C. H. Kwak
  • , Y. B. Lee
  • , S. Y. Seo
  • , S. H. Kim
  • , C. I. Park
  • , B. H. Kim
  • , Zhenlan Jin
  • , S. W. Han*
  • *Corresponding author for this work

Research output: Contribution to journalJournal articlepeer-review

Abstract

This study examined the micro-structural and electrical properties of N +-ion-implanted ZnO nanorods. Nitrogen ions with energies of 10-90 keV and beam fluxes of 10 13-10 16 ions/cm 2 were implanted on vertically-aligned ZnO nanorods. Energy dispersive X-ray spectroscopy measurements showed that N ions were spread uniformly over the nanorods. Extended X-ray absorption fine structure measurements revealed that the implanted N +s had partially substituted for the oxygen sites. Photoluminescence measurements showed a neutral-donor bound exciton peak at 3.36 eV and a two-electron-satellite peak at 3.33 eV independent of the ion energy and flux. The I-V characteristic curves showed that the current density was not changed by the N + ion energy and flux much. These results strongly suggested that the N ions substituted for the oxygen sites were neutral.

Original languageEnglish
Pages (from-to)7420-7423
Number of pages4
JournalJournal of nanoscience and nanotechnology
Volume11
Issue number8
DOIs
StatePublished - 2011.08

Keywords

  • EXAFS
  • I-V
  • Ion implantation
  • Nanorod
  • Photoluminescence
  • Structure
  • ZnO

Quacquarelli Symonds(QS) Subject Topics

  • Materials Science
  • Engineering - Chemical
  • Chemistry
  • Physics & Astronomy
  • Biological Sciences

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